x-ray diffraction

Diffraktometer D8 Brucker

X-ray diffraction (XRD) is a non-destructive analytical technique used to identify and characterize solid samples. Information on the crystallographic structure can be obtained without complex sample preparation and with low amount of sample. For any given crystalline material, both the position and the intensity of the lines on the diffractogram are indicative of a particular phase (“fingerprint”). Quantitative information on a sample can be obtained by applying a full pattern analysis technique, such as the Rietveld method for example.

Powder X-ray diffractograms are collected in reflection mode using a D8 ADVANCE (Bruker) diffractometer located in the controlled area of INE. X-rays are produced from a Cu anode and the intensity of the scattered radiation is detected with an energy dispersive detector (SOL-X). The sample stage concept allows analyses of powders, oriented or textured samples (such as sheet silicates), air-sensitive and/or active samples (closed and airtight sample holder).

Information provided by XRD is of key importance in various areas of the research activities at INE. Besides determining the mineralogical composition of natural samples, XRD is used to characterize samples after corrosion experiments (nuclear waste glass, cement waste form…), the purity of synthetic samples from (co)precipitation experiments (retention of radionuclides in solid phases, identification of precipitates).

 

 

Contact:

Dr. Nicolas Finck     

   +49 721 608 24321